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Dual-Axis 5 g Accelerometer with SPI Interface ADIS16006
FEATURES
Dual-axis accelerometer SPI(R) digital output interface Internal temperature sensor Highly integrated; minimal external components Bandwidth externally selectable 1.9 mg resolution at 60 Hz Externally controlled electrostatic self-test 3.0 V to 5.25 V single-supply operation Low power: <2 mA 3500 g shock survival 7.2 mm x 7.2 mm x 3.6 mm package
GENERAL DESCRIPTION
The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI). An integrated temperature sensor is also available on the SPI interface. The ADIS16006 measures acceleration with a fullscale range of 5 g (minimum). The ADIS16006 can measure both dynamic acceleration (that is, vibration) and static acceleration (that is, gravity). The typical noise floor is 200 g/Hz, allowing signals below 1.9 mg (60 Hz bandwidth) to be resolved. The bandwidth of the accelerometer is set with optional capacitors, CX and CY, at the XFILT and YFILT pins. Digital output data for both axes is available via the serial interface. An externally driven self-test pin (ST) allows the user to verify the accelerometer functionality. The ADIS16006 is available in a 7.2 mm x 7.2 mm x 3.6 mm, 12-terminal LGA package.
APPLICATIONS
Industrial vibration/motion sensing Platform stabilization Dual-axis tilt sensing Tracking, recording, analysis devices Alarms, security devices
FUNCTIONAL BLOCK DIAGRAM
VCC
ADIS16006
SCLK DUAL-AXIS 5g ACCELEROMETER CDC SERIAL INTERFACE DIN DOUT CS TCS
TEMP SENSOR
COM
ST
YFILT CY
XFILT CX
05975-001
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 (c)2006 Analog Devices, Inc. All rights reserved.
ADIS16006 TABLE OF CONTENTS
Features .............................................................................................. 1 Applications....................................................................................... 1 General Description ......................................................................... 1 Functional Block Diagram .............................................................. 1 Revision History ............................................................................... 2 Specifications..................................................................................... 3 Timing Characteristics ................................................................ 4 Circuit and Timing Diagrams..................................................... 4 Absolute Maximum Ratings............................................................ 6 ESD Caution.................................................................................. 6 Pin Configuration and Function Descriptions............................. 7 Typical Performance Characteristics ............................................. 8 Theory of Operation ...................................................................... 11 Self-Test ....................................................................................... 11 Serial Interface ............................................................................ 11 Accelerometer Serial Interface.................................................. 11 Temperature Sensor Serial Interface........................................ 12 Power Supply Decoupling ......................................................... 12 Setting the Bandwidth ............................................................... 13 Selecting Filter Characteristics: The Noise/Bandwidth Trade-Off ............................................. 13 Applications..................................................................................... 14 Second Level Assembly ............................................................. 14 Outline Dimensions ....................................................................... 15 Ordering Guide .......................................................................... 15
REVISION HISTORY
3/06--Revision 0: Initial Version
Rev. 0 | Page 2 of 16
ADIS16006 SPECIFICATIONS
TA = -40C to +125C, VCC = 5 V, CX = CY = 0 F, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1.
Parameter ACCELEROMETER SENSOR INPUT Measurement Range 1 Nonlinearity Package Alignment Error Alignment Error Cross Axis Sensitivity ACCELEROMETER SENSITIVITY Sensitivity at XFILT, YFILT Sensitivity Change due to Temperature 2 ZERO g BIAS LEVEL 0 g Voltage at XFILT, YFILT 0 g Offset vs. Temperature ACCELEROMETER NOISE PERFORMANCE Noise Density ACCELEROMETER FREQUENCY RESPONSE 3, 4 CX, CY Range RFILT Tolerance Sensor Bandwidth Sensor Resonant Frequency ACCELEROMETER SELF-TEST Logic Input Low Logic Input High ST Input Resistance to COM Output Change at XOUT, YOUTT 5 TEMPERATURE SENSOR Accuracy Resolution Update Rate Temperature Conversion Time DIGITAL INPUT Input High Voltage (VINH) Input Low Voltage (VINL) Input Current Input Capacitance DIGITAL OUTPUT Output High Voltage (VOH) Output Low Voltage (VOL) Conditions Each axis % of full scale X sensor to Y sensor Each axis 242 Delta from 25C Each axis 1905 256 0.3 2048 0.1 200 0 24 CX = 0F, CY = 0F 10 40 272 LSB/g % LSB LSB/C g/Hz rms F k kHz kHz V V k LSB C Bits s s V V V A pF V V Min 5 0.5 1.5 0.1 1.5 2.5 Typ Max Unit g % degrees degrees %
3
2190
@ 25C
32 2.26 5.5
0.2 x VCC 0.8 x VCC 30 102 50 205 2 10 400 25 2.4 2.1 -10 1 10 0.8 10
Self-Test 0 to Self-Test 1 VCC = 3 V to 5.25 V
307
VCC = 4.75 V to 5.25 V VCC = 3.0 V to 3.6 V VCC = 3.0 V to 5.25 V VIN = 0 V or VCC
ISOURCE = 200 A, VCC = 3.0 V to 5.25 V ISINK = 200 A
VCC - 0.5 0.4
Rev. 0 | Page 3 of 16
ADIS16006
Parameter POWER SUPPLY Operating Voltage Range Quiescent Supply Current Power-Down Current Turn-On Time 6
1
Conditions
Min 3.0
Typ
Max 5.25 1.9
Unit V mA mA ms
FSCLK = 50 kSPS CX, CY = 0.1 F
1.5 1.0 20
Guaranteed by measurement of initial offset and sensitivity. 2 Defined as the output change from ambient to maximum temperature or ambient to minimum temperature. 3 Actual bandwidth response controlled by user-supplied external capacitor (CX, CY). 4 See the Setting the Bandwidth section for more information on how to reduce the bandwidth. 5 Self-test response changes as the square of VCC. 6 Larger values of CX and CY increase turn-on time. Turn-on time is approximately (160 x (0.0022 + CX or CY) + 4) in milliseconds, where CX and CY are in F.
TIMING CHARACTERISTICS
TA = -40C to +125C, acceleration = 0 g, unless otherwise noted. Table 2.
Parameter 1, 2 fSCLK 3 tCONVERT tACQ t1 t2 4 t34 t4 t5 t6 t7 t8 5 t9
1
VCC = 3.3 V 10 2 14.5 x tSCLK 1.5 x tSCLK 10 60 100 20 20 0.4 x tSCLK 0.4 x tSCLK 80 5
VCC = 5 V 10 2 14.5 x tSCLK 1.5 x tSCLK 10 30 75 20 20 0.4 x tSCLK 0.4 x tSCLK 80 5
Unit kHz min MHz max
Description
ns min ns max ns max ns min ns min ns min ns min ns max s typ
Throughput time = tCONVERT + tACQ = 16 x tSCLK TCS/CS to SCLK setup time Delay from TCS/CS until DOUT three-state disabled Data access time after SCLK falling edge Data setup time prior to SCLK rising edge Data hold time after SCLK rising edge SCLK high pulse width SCLK low pulse width TCS/CS rising edge to DOUT high impedance Power-up time from shutdown
Guaranteed by design. All input signals are specified with tR and tF = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V. 2 See Figure 3 and Figure 4. 3 Mark/space ratio for the SCLK input is 40/60 to 60/40. 4 Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with VCC = 3.3 V and time for an output to cross 0.8 V or 2.4 V with VCC = 5.0 V. 5 t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the Timing Characteristics is the true bus relinquish time of the part and is independent of the bus loading.
CIRCUIT AND TIMING DIAGRAMS
200A
IOL
TO OUTPUT PIN
1.6V CL 50pF 200A IOH
05975-002
Figure 2. Load Circuit for Digital Output Timing Specifications
Rev. 0 | Page 4 of 16
ADIS16006
tACQ tCONVERT
CS
t1
SCLK 1 2
t6
3 4 5 6 15 16
t2
DOUT THREE-STATE
t7
4 LEADING ZEROS
t3
DB11 DB10 DB9 DB0
t8
THREE-STATE
t4
DIN DON'T CARE ZERO ZERO ZERO ADD0 ONE ZERO PM0
05975-003
t5
Figure 3. Accelerometer Serial Interface Timing Diagram
TCS
t1
SCLK THREESTATE 1 2
t6
3 4 11 15 16
t3
LEADING ZERO DB9
t7
DB8 DB0
t8
THREE-STATE
DOUT
DIN
Figure 4. Temperature Serial Interface Timing Diagram
Rev. 0 | Page 5 of 16
05975-004
ADIS16006 ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) VCC All Other Pins Output Short-Circuit Duration (Any Pin to Common) Operating Temperature Range Storage Temperature Rating 3500 g 3500 g -0.3 V to +7.0 V (COM - 0.3 V) to (VCC + 0.3 V) Indefinite -40C to +125C -65C to +150C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Table 4. Package Characteristics
Package Type 12-Lead LGA CA 200C/W JC 25C/W Device Weight 0.3 grams
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
1.0755 8x BSC
0.670 8x BSC
5.873 2x
1.127 12x BSC
0.500 12x BSC
Figure 5. Second Level Assembly Pad Layout
Rev. 0 | Page 6 of 16
05975-005
ADIS16006 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
SCLK VCC
12 11 10
TCS
1
CS
9
XFILT
ADIS16006
DOUT
2
TOP VIEW (Not to Scale)
8
YFILT
DIN
3
7
NC
4
5
6
COM
NC
ST
NC = NO CONNECT
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. 1 2 3 4 5, 7 6 8 9 10 11 12 Mnemonic TCS DOUT DIN COM NC ST YFILT XFILT CS VCC SCLK Description Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature sensor output. Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream. The bits are clocked out on the falling edge of the SCLK input. Data In, Logic Input. Data to be written into the ADIS16006's control register is provided on this input and is clocked into the register on the rising edge of SCLK. Common. Reference point for all circuitry on the ADIS16006. No Connect. Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose. Y Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. X Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise contribution from the accelerometer. Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output. Power Supply Input. The VCC range for the ADIS16006 is 3.0 V to 5.25 V. Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data to the control register. This clock input is also used as the clock source for the ADIS16006's conversion process.
Rev. 0 | Page 7 of 16
05975-006
ADIS16006 TYPICAL PERFORMANCE CHARACTERISTICS
25
262 261 260
SENSITIVITY (LSB/g)
AVERAGE = 2040.66 STANDARD DEVIATION = 23.19
B3-X B1-Y B5-X B2-X B1-X B5-Y B4-X B2-Y B4-Y
PERCENT OF POPULATION (%)
B3-Y
20
259 258 257 256 255
15
10
5
1995
2000
2005
2010
2015
2020
2025
2030
2035
2040
2045
2050
2055
2060
2065
2070
2075
2080
2085
05975-007
-25
0
25
50
75
100
125
150
TEMPERATURE (C)
OUTPUT (LSB)
Figure 7. Sensitivity vs. Temperature (1 g Stimulus)
40
Figure 10. X-Axis 0 g Bias at 25C
AVERAGE = 2055.875 STANDARD DEVIATION = 6.464
2048
35
2046
BIAS LEVEL (LSB)
PERCENT OF POPULATION (%)
5.25V AVG AT 5.25V
30 25 20 15 10 5 0
2044 AVG AT 3.60V
AVG AT 4.75V
2042 AVG AT 3.30V AVG AT 3.00V 2040
1995
2000
2005
2010
2015
2020
2025
2030
2035
2040
2045
2050
2055
2060
2065
2070
2075
2080
2085
-20
0
20
40
60
80
100
120
05975-008
TEMPERATURE (C)
OUTPUT (LSB)
Figure 8. X-Axis 0 g Bias vs. Temperature
2048 2047
PERCENT OF POPULATION (%) 60
Figure 11. Y-Axis 0 g Bias at 25C
2046
BIAS LEVEL (LSB)
50
2045 2044
+125C
40
+25C 2043 2042 -40C 2041 2040 2039
05975-009
30
20
10
3.5
4.0 VCC (V)
4.5
5.0
5.5
80
85
90
95 100 105 110 115 120 125 130 135 140 NOISE (g/ Hz)
Figure 9. X-Axis 0 g Bias vs. Supply Voltage
Figure 12. Noise (X-Axis) at VCC = 5 V, 25C
Rev. 0 | Page 8 of 16
05975-012
2038 3.0
0
05975-011
2038 -40
2090
05975-010
254 -50
2090
0
ADIS16006
45 40 250 AVG AT 5.25V
PERCENT OF POPULATION (%)
35
200
AVG AT 5.00V
SELF TEST (LSB)
30 25 20 15 10 5
05975-013
AVG AT 4.75V 150
100
AVG AT 3.60V AVG AT 3.30V AVG AT 3.00V
50
80
85
90
95 100 105 110 115 120 125 130 135 140 NOISE (g/ Hz)
0
50 TEMPERATURE (C)
100
150
Figure 13. Noise (Y-Axis) at VCC = 5 V, 25C
40 35 AVERAGE = 202.2137 STANDARD DEVIATION = 12.09035
250 230
Figure 16. Self-Test X-Axis vs. Temperature
+125C 210
PERCENT OF POPULATION (%)
30
190
SELF TEST (LSB)
25 20 15 10
+25C 170 150 130 110 90 -40C
5 0 110 130 150 170 190 210 230 250 270 290 OUTPUT (LSB)
70
05975-014
3.5
4.0 VCC (V)
4.5
5.0
5.5
Figure 14. X-Axis Self-Test at 25C, VCC = 5 V
40 35 AVERAGE = 82.89281 STANDARD DEVIATION = 4.908012
1.8
Figure 17. Self-Test X-Axis vs. Supply Voltage
+125C 1.7 1.6
PERCENT OF POPULATION (%)
30
CURRENT (mA)
25 20 15 10 5 0 40 45 50 55 60 65 70 75 80 85 90 95 100 105 110 OUTPUT (LSB)
+25C 1.5 1.4 1.3 1.2 1.1 1.0 3.0 -40C
05975-015
3.5
4.0 VCC (V)
4.5
5.0
5.5
Figure 15. X-Axis Self-Test at 25C, VCC = 3.3 V
Figure 18. Supply Current vs. Supply Voltage
Rev. 0 | Page 9 of 16
05975-018
05975-017
50 3.0
05975-016
0
0 -50
ADIS16006
45 VCC = 5.0V VCC = 3.3V 1.2 1.1 25 1.3
PERCENT OF POPULATION (%)
35
CURRENT (mA)
+125C 1.0 0.9 0.8 +25C -40C
15
5 0.7 0.6 3.0
05975-023
1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55 1.59 CURRENT (mA)
3.5
4.0 VCC (V)
4.5
5.0
5.5
Figure 19. Supply Current at 25C
60 VCC = 5.0V VCC = 3.3V
Figure 21. Power-Down Supply Current vs. Supply Voltage
0.6 0.4 0.2
PERCENT OF POPULATION (%)
50
40
SAMPLING ERROR
0 -0.2 -0.4 -0.6
30
20
10
-0.8 -1.0 1 10 FREQUENCY (MHz) 100
0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06 1.10 CURRENT (mA)
Figure 20. Power-Down Supply Current
05975-019
Figure 22. Sampling Error vs. Sampling Frequency
Rev. 0 | Page 10 of 16
05975-024
0
05975-020
-5
ADIS16006 THEORY OF OPERATION
The ADIS16006 is a low cost, low power, complete dual-axis accelerometer with an integrated serial peripheral interface (SPI) and an integrated temperature sensor whose output is also available on the SPI interface. The ADIS16006 is capable of measuring acceleration with a full-scale range of 5 g (minimum). The ADIS16006 can measure both dynamic acceleration (that is, vibration) and static acceleration (that is, gravity).
Accelerometer Control Register
MSB
DONTC ZERO ZERO ZERO ZERO ONE ZERO
LSB
PM0
Table 6. Accelerometer Control Register Bit Functions
Bit 7 6, 5, 4 3 Mnemonic DONTC ZERO ADD0 Comments Don't care. Can be 1 or 0. These bits should be held low. This address bit selects the X-axis or Y-axis outputs. A 0 selects the X-axis; a 1 selects the Y-axis. This bit should be held high. This bit should be held low. This bit selects the operation mode for the accelerometer; set to 0 for normal operation and 1 for power-down mode.
SELF-TEST
The ST pin controls the self-test feature. When this pin is set to VCC, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to test if the accelerometer is functional. The typical change in output is 801 mg (corresponding to 205 LSB) for VCC = 5.0 V. This pin may be left open-circuit or connected to common in normal use. The ST pin should never be exposed to voltage greater than VCC + 0.3 V. If the system design is such that this condition cannot be guaranteed (that is, multiple supply voltages present), a low VF clamping diode between ST and VCC is recommended.
2 1 0
ONE ZERO PM0
Power-Down
By setting PM0 to 1 when updating the accelerometer control register, the ADIS16006 is put into a shutdown mode. The information stored in the control register is maintained during shutdown. The ADIS16006 changes modes as soon as the control register is updated. Therefore, if the part is in shutdown mode and PM0 is changed to 0, the part powers up on the 16th SCLK rising edge.
SERIAL INTERFACE
The serial interface on the ADIS16006 consists of five wires: CS, TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the temperature sensor data are available on the serial interface. The CS and TCS are used to select the accelerometer or temperature sensor outputs, respectively. CS and TCS cannot be active at the same time. The SCLK input provides access to data from the internal data registers.
ADD0
By setting ADD0 to 0 when updating the accelerometer control register, the X-axis output is selected. By setting ADD0 to 1, the Y-axis output is selected.
ZERO
ZERO is defined as the logic low level.
ACCELEROMETER SERIAL INTERFACE
Figure 3 shows the detailed timing diagram for serial interfacing to the accelerometer in the ADIS16006. The serial clock provides the conversion clock. CS initiates the conversion process and data transfer and also frames the serial data transfer for the accelerometer output. The accelerometer output is sampled on the second rising edge of the SCLK input after the falling edge of the CS. The conversion requires 16 SCLK cycles to complete. The rising edge of CS puts the bus back into three-state. If CS remains low, the next digital conversion is initiated. The details for the control register bit functions are shown in Table 6.
ONE
ONE is defined as the logic high level.
DONTC
DONTC is defined as don't care and can be a low or high logic level.
Accelerometer Conversion Details
Every time the accelerometer is sampled, the sampling function discharges the internal CX or CY filtering capacitors by up to 2% of their initial values (assuming no additional external filtering capacitors have been added). The recovery time for the filter capacitor to recharge is approximately 10 s. Thus, sampling the accelerometer at a rate of 10 kSPS or less does not induce a sampling error. However, as sampling frequencies increase above 10 kSPS, one can expect sampling errors to attenuate the actual acceleration levels.
Rev. 0 | Page 11 of 16
ADIS16006
TEMPERATURE SENSOR SERIAL INTERFACE
Read Operation
Figure 4 shows the timing diagram for a serial read from the temperature sensor. The TCS line enables the SCLK input. Ten bits of data and a leading 0 are transferred during a read operation. Read operations occur during streams of 16 clock pulses. The serial data can be received into two bytes to accommodate the entire 10-bit data stream. If only eight bits of resolution are required, then the data can be received into a single byte. At the end of the read operation, the DOUT line remains in the state of the last bit of data clocked out until TCS goes high, at which time the DOUT line from the temperature sensor goes three-state. Note that if the TCS is brought low every 350 s (30%) or less, the same temperature value is output onto the DOUT line every time without changing. It is recommended that the TCS line not be brought low every 350 s (30%) or less. The 30% covers process variation. The TCS should become active (high to low) outside this range. The device is designed to autoconvert every 350 s. If the temperature sensor is accessed during the conversion process, an internal signal is generated to prevent any update of the temperature value register during the conversion. This prevents the user from reading back spurious data. The design of this feature results in this internal lockout signal being reset only at the start of the next autoconversion. Therefore, if the TCS line goes active before the internal lockout signal is reset to its inactive mode, the internal lockout signal is not reset. To ensure that no lockout signal is set, bring TCS low at a greater time than 350 s (30%). As a result, the temperature sensor is not interrupted during a conversion process. In the automatic conversion mode, every time a read or write operation takes place, the internal clock oscillator is restarted at the end of the read or write operation. The result of the conversion is typically available 25 s later. Reading from the device before conversion is complete provides the same set of data. Table 8. Temperature Sensor Data Format
Temperature -40C -25C -0.25C 0C +0.25C +10C +25C +50C +75C +100C +125C Digital Output (DB9 ... DB0) 11 0110 0000 11 1001 1100 11 1111 1111 00 0000 0000 00 0000 0001 00 0010 1000 00 0110 0100 00 1100 1000 01 0010 1100 01 1001 0000 01 1111 0100
Write Operation
Figure 4 also shows the timing diagram for the serial write to the temperature sensor. The write operation takes place at the same time as the read operation. Data is clocked into the control register on the rising edge of SCLK. DIN should remain low for the entire cycle.
Temperature Sensor Control Register
MSB
ZERO ZERO ZERO ZERO ZERO ZERO ZERO
LSB
ZERO
Table 7. Temperature Sensor Control Register Bit Functions
Bit 7 to 0 Mnemonic ZERO Comments All bits should be held low.
ZERO
ZERO is defined as the logic low level.
Output Data format
The output data format for the temperature sensor is twos complement. Table 8 shows the relationship between the digital output and the temperature.
Temperature Sensor Conversion Details
The ADIS16006 features a 10-bit digital temperature sensor that allows accurate measurement of the ambient device temperature. The conversion clock for the temperature sensor is internally generated so no external clock is required except when reading from and writing to the serial port. In normal mode, an internal clock oscillator runs the automatic conversion sequence. A conversion is initiated approximately every 350 s. At this time, the temperature sensor wakes up and performs a temperature conversion. This temperature conversion typically takes 25 s, at which time the temperature sensor automatically shuts down. The result of the most recent temperature conversion is available in the serial output register at any time. Once the conversion is finished, an internal oscillator starts counting and is designed to time out every 350 s. The temperature sensor then powers up and does a conversion.
POWER SUPPLY DECOUPLING
The ADIS16006 integrates two decoupling capacitors that are 0.047 F in value. For local operation of the ADIS16006, no additional power supply decoupling capacitance is required. However, if the system power supply presents a substantial amount of noise, additional filtering can be required. If additional capacitors are required, connect the ground terminal of each of these capacitors directly to the underlying ground plane. Finally, note that all analog and digital grounds should be referenced to the same system ground reference point.
Rev. 0 | Page 12 of 16
ADIS16006
SETTING THE BANDWIDTH
The ADIS16006 has provisions for band limiting the accelerometer. Capacitors can be added at the XFILT and YFILT pins to implement further low-pass filtering for antialiasing and noise reduction. The equation for the 3 dB bandwidth is F-3dB = 1/(2(32 k) x (C(XFILT, YFILT) + 2200 pF)) or more simply, F-3dB = 5 F/(C(XFILT, YFILT) + 2200 pF) The tolerance of the internal resistor (RFILT) can vary typically as much as 25% of its nominal value (32 k); thus, the bandwidth varies accordingly. A minimum capacitance of 0 pF for CXFILT and CYFILT is allowable. Table 9. Filter Capacitor Selection, CXFILT and CYFILT
Bandwidth (Hz) 1 10 50 100 200 400 2250 Capacitor (F) 4.7 0.47 0.10 0.047 0.022 0.01 0
With the single pole roll-off characteristic, the typical noise of the ADIS16006 is determined by rmsNoise = (200 g/root Hz) x (root (BW x 1.57)) At 100 Hz, the noise is rmsNoise = (200 g/root Hz) x (root (100 x 1.57)) =2.5 mg Often, the peak value of the noise is desired. Peak-to-peak noise can be estimated only by statistical methods. Table 10 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 10. Estimation of Peak-to-Peak Noise
Peak-to-Peak Value 2 x rms 4 x rms 6 x rms 8 x rms Percentage of Time That Noise Exceeds Nominal Peak-to-Peak Value 32% 4.6% 0.27% 0.006%
12
11
10
1
DIGITAL OUTPUT (IN LSBs) X-AXIS: 1792 Y-AXIS: 2048
2
3
4
5
6 3 4 2 1 12 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 1792 7 8 9 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2048 10 11
SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF
The accelerometer bandwidth selected ultimately determines the measurement resolution (smallest detectable acceleration). Filtering can be used to lower the noise floor, which improves the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XFILT and YFILT. The ADIS16006 has a typical bandwidth of 2.25 kHz with no external filtering. The analog bandwidth may be further decreased to reduce noise and improve resolution. The ADIS16006 noise has the characteristics of white Gaussian noise, which contributes equally at all frequencies and is described in terms of g/Hz (that is, the noise is proportional to the square root of the accelerometer's bandwidth). The user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer.
9 10
8
7 6
DIGITAL OUTPUT (IN LSBs) X-AXIS: 2048 Y-AXIS: 2304
Top View Not to Scale
11
5
7 5 6 6 5 4 DIGITAL OUTPUT (IN LSBs) X-AXIS: 2304 Y-AXIS: 2048 10 11 12
05975-021
12
1
2
3
4
7
8
9
Figure 23. Output Response vs. Orientation
Rev. 0 | Page 13 of 16
1
2
3
8
9
ADIS16006 APPLICATIONS
SECOND LEVEL ASSEMBLY
The ADIS16006 can be attached to the second-level assembly board using SN63 (or equivalent) or lead-free solder. Figure 24 and Table 11 provide acceptable solder reflow profiles for each solder type. Note that these profiles cannot be the optimum profile for the user's application. In no case shall 260C be exceeded. It is recommended that the user develop a reflow profile based upon the specific application. In general, keep in mind the lowest peak temperature and shortest dwell time above the melt temperature of the solder result in less shock and stress to the product. In addition, evaluating the cooling rate and peak temperature can result in a more reliable assembly.
TP RAMP-UP
Table 11.
Profile Feature Average Ramp Rate (TL to TP) Preheat Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) Time (TSMIN to TSMAX) (ts) TSMAX to TL Ramp-Up Rate Time Maintained Above Liquidous (TL) Liquidous Temperature (TL) Time (tL) Peak Temperature (TP) Time Within 5C of Actual Peak Temperature (tp) Ramp-Down Rate Time 25C to Peak Temperature
05975-022
Condition Sn63/Pb37 Pb-free 3C/sec max 3C/sec max 100C 150C 60 sec to 120 sec 3C/sec 150C 200C 60 sec to 150 sec 3C/sec
tP
CRITICAL ZONE TL TO TP
TEMPERATURE
TL
TSMAX TSMIN
tL
tS
PREHEAT
RAMP-DOWN
183C 60 sec to 150 sec 240C + 0C/-5C 10 sec to 30 sec 6C/sec max 6 min max
217C 60 sec to 150 sec 260C + 0C/-5C 20 sec to 40 sec 6C/sec max 8 min max
t25C TO PEAK
TIME
Figure 24. Acceptable Solder Reflow Profiles
Rev. 0 | Page 14 of 16
ADIS16006 OUTLINE DIMENSIONS
7.33 MAX SQ 1.3025 BSC
10
PIN 1 INDICATOR
12
1.00 BSC
9 1
PIN 1 INDICATOR
0.797 BSC
7 6 4
3
TOP VIEW
5.00 TYP
0.227 BSC (4 PLCS)
BOTTOM VIEW
0.373 BSC (12 PLCS)
3.60 MAX
031706-A
SIDE VIEW
Figure 25. 12-Terminal Land Grid Array [LGA] (CC-12-1) Dimensions shown in millimeters
ORDERING GUIDE
Model ADIS16006CCCZ 1 ADIS16006/PCB
1
Temperature Range -40C to +125C
Package Description 12-Terminal Land Grid Array (LGA) Evaluation Board
Package Option CC-12-1
Z = Pb-free part.
Rev. 0 | Page 15 of 16
ADIS16006 NOTES
(c)2006 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05975-0-3/06(0)
T T
Rev. 0 | Page 16 of 16

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